Avantgarde Room Temperature Manual Probe Stations are mainly used to provide a test platform for the electrical parameter testing of semiconductor chips, with different external measuring instruments, with measuring instruments can be completed with integrated circuits such as voltage, current, resistance and capacitance-voltage characteristic curves and other parameters of the test, for the non-destructive testing of chips, wafers and devices at room temperature.

PSM series room temperature manual probe table is a high-quality probe table is able to conduct a large number of non-destructive, standard electrical experiments on 2-inch, 4-inch, 6-inch, 8-inch wafers, external different test equipment, can complete the electrical characteristics of the device measurement, parameter measurement, DC measurement. The scientific desktop design is the best choice for academic and experimental research.

Main Features:

• Stabilized dual displacement adjustment system adjusts the displacement of the sample holder and probe arm.
• The sample holder can hold samples up to 8" wafers and utilizes a porous partition for controlled gas adsorption fixation.
• The sliding table under the sample holder can be moved with a maximum travel of ±100mm in X-Y axis, making sample testing and changeover more convenient. The slide is fixed by magnetic adsorption.
• Up to 6 probe arms can be mounted.
• The probe arms are magnetized and can be moved arbitrarily, and can be fine-tuned in three dimensions for easy operation and precise pinning, and the probes of the four probe arms can be pinned to any position of the sample.
• The probe arm adopts three coaxial cables and three coaxial connectors, the leakage current is small, within 100fA.
• The maximum magnification of CCD is 180 times, and the maximum working distance is 100mm.

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